Sensor-Based Diffraction System - OS-8452
Enables students to scan many diffraction and interference patterns during one lab period.
Product Summary
The Sensor-Based Diffraction System enables students to scan many diffraction and interference patterns during one lab period. They can study the differences caused by changing the slit width, slit separation, and number of slits. And, with the addition of the Green Diode Laser, they can study the difference caused by changing the wavelength.
Scanning with the Linear Translator (on page 279): In this unique scanning system, the diffraction pattern is scanned using a light sensor attached to a Rotary Motion Sensor. As the wheel on the Rotary Motion Sensor is rotated by hand, the Rotary Motion Sensor moves along a gear rack (called the Linear Translator). Students make the association between the diffraction pattern they see and the real-time graph of the light intensity vs. position.